The Journal of Kharkov National University, Vol. 657,
Physical series "NUCLEI, PARTICLES, FIELDS", Issue 1/26/, 2005
| L.N. Davydov, A.A. Zakharchenko, D.V. Kutny, V.E. Kutny, I.M. Neklyudov, A.V. Rybka, I.N. Shlyakhov
Radiation hardness of semiconductor detectors for corpuscular and gamma-radiation (Rus.)
| S.A. Duplij, O.I. Kotulska, A.S. Sadovnikov
Constant solutions of quantum Yang-Baxter equation over Grassmann algebra (Rus.)
| L.D. Lobzov, A.P. Tolstoluzhsky, N.G. Shulika
On the theory of electron multipacting in a vacuum cell of linear accelerator (Rus.)
| V.N. Bondarenko, A.I. Belyaeva, V.S. Voitsenya, A.A. Galuza, V.G. Konovalov, D.I. Naidenkova, A.N. Shapoval, A.F. Shtan', S.I. Solodovchenko
Experimental and numerical studies of carbon film effect on the optical properties of metallic mirrors (Rus.)
| E.Yu. Bannikova
Determination of maximum energy of accelerated particles in jet knots of extra Galaxy sources (Rus.)
| V.N. Melnykov, V.A. Litvinov, V.T. Koppe, V.V. Bobkov, V.V. Tovstyak
Studies of processes taking place at SIMS analysis in glycerol solutions of organic dyes (Rus.)
| S.V. Vlasova, A.A. Shishkin
Resonance phenomena of charged particle motion in ambipolar electric field and helical magnetic field of a toroidal trap (Rus.)
| I.G. Marchenko
Computer simulation of films deposition under sufficient surface diffusion (Rus.)
| N.I. Ayzatsky, V.N.Boriskin, V.A.Gurin, A.N.Savchenko, A.A.Sarvilov, V.I.Tatanov
The distribution density monitoring of the electron beam in air (Rus.)
| N.V. Sydorenko, S.I. Kononenko, V.P. Zhurenko
Mean energy of electrons emitted from solids under swift light ion bombardment
| A.N. Styervoyedov, V.I. Farenik
X-ray photoelectron spectroscopy of ultra thin titanium and titanium nitride films, obtained by ion beam sputter deposition (Rus.)
| K.V. Korytchenko
Gas-dynamic expantion of spark channel upto moment of a shock wave formation (Rus.)
| V.I. Kovalenko, V.D. Kotsubanov, I.K. Nikol’skii, F.I. Ozherel’yev, S.A. Tsybenko
A bolometric sensor for radiation loss measurements in the uragan-3m torsatpon (Rus.)
|Proceedings of International Scientific Conference "Karazin naturalists study" 2004.|
14-16 June, 2004, Kharkiv national university named Karazin, Kharkiv.
| S.A. Duplij, V.V. Kalashnikov, E.A. Maslov
Quantum information, qubits and quantum algorithms (Rus.)
| S.D. Sinel’shchikov, L.L. Vaksman
Quantum groups and non-commutative complex analysis
| V.D. Gershun
Integrable string models of hydrodynamical type
| I.G. Kharin
About quantum kinematics and dynamics on superspace within the framework of Schwinger’s approach (Rus.)
RADIATION HARDNESS OF SEMICONDUCTOR DETECTORS FOR CORPUSCULAR AND GAMMA-RADIATION
L.N. Davydov, A.A. Zakharchenko, D.V. Kutny, V.E. Kutny, I.M. Neklyudov, A.V. Rybka, I.N. Shlyakhov
Full Text : (190 kB, Rus.)
During its operation an X-ray or γ-ray semiconductor detector is intrinsically subjected to radiation damage, which deteriorates the device characteristics and can cause its failure. The radiation damage in γ-ray dosimeter semiconductor detectors degrades their count characteristics. In spectroscopy semiconductor detectors the energy resolution aggravates, the leakage current increases, and the position of the photopeak shifts to smaller energy values. In this review the current level of understanding of the semiconductor detectors radiation
degradation is described and some available methods of detector service-life prolongation are pointed out. The information about radiation hardness of silicon detectors as the most investigated, and of wide-zone semiconductor detectors, recently widely applied, such as CVD diamond, CdTe and CdZnTe, is given. The researches of radiation service-life of dosimetry
and spectrometry detectors from CdTe and CdZnTe, carried out in NSC KIPT, are described. The obtained count characteristics and 137Cs pulse spectra are indicated as functions of an
absorbed doze of gamma-radiation. It is shown, that the detectors from CdTe and CdZnTe have increased radiation hardness compared to conventional silicon detectors. The spectrometry detectors conserve the ability to discriminate the gamma-radiation energy up to the absorbed dose about 20 kGy, and the dosimetry detectors continue to register the dose
up to several hundreds of kGy.
KEY WORDS: radiation damage, semiconductor detector, γ-rays, particle irradiation, silicon, CdTe, CdZnTe.
ON THE THEORY OF ELECTRON MULTIPACTING IN A VACUUM CELL OF LINEAR ACCELERATOR
L.D. Lobzov, A.P. Tolstoluzhsky, N.G. Shulika
Full Text : (460 kB, Rus.)
Some operation peculiarities of the vacuum charged accelerator structure are caused by resonant secondary-electron process emission and bombardment of parallel parts of electrode surfaces in diode gaps forming structure electrical fields. At the accelerated electron energies defined, and values of secondary emission factors, that may reduce to intensive electron
fluxes, disturbing accelerator operation. In this case reactive and active parameters of structures and their gaps not only, but also amplitude phase performance of their electrical fields influencing on the general character of the secondary electron process behavior. On the model of the parallel oscillating contour similar to the vacuum accelerator cell, perturbative by multipacting, the resonant movement of secondary emitting electrons in the diode gap has been considered theoretically. It's shown, that electron multipacting may exist in increasing and lowering electrical fields. Limiting values of high qualities loaded by secondary electron emission of the accelerating structure cell characterizing limit rates of voltage changes (variations) to suppress electron multipacting are indicated.
KEY WORDS: linear accelerator, vacuum accelerating cell, electrical sparking, vacuum multipacting.
EXPERIMENTAL AND NUMERICAL STUDIES OF CARBON FILM EFFECT ON THE OPTICAL PROPERTIES OF METALLIC MIRRORS
V.N. Bondarenko, A.I. Belyaeva, V.S. Voitsenya, A.A. Galuza, V.G. Konovalov, D.I. Naidenkova, A.N. Shapoval, A.F. Shtan', S.I. Solodovchenko
Full Text : (450 kB, Rus.)
The transport of erosion material inside the fusion device vacuum chamber and its deposition onto surfaces being remote from confined plasma is one of reasons of the deterioration of in-vessel diagnostic mirrors. The main component in the deposit is carbon because graphite is used as a protection material of vessel walls and divertor plates. In order to study the effects
associated with mirrors contamination, the model experiments were carried out with a-C films deposited on stainless steel mirrors in operating Large Helical Device (LHD), and Mo mirrors and glass plates in special stands. After mirrors had been extracted from devices, their reflection power values were gradually restored inside the stand in IPP NSC KIPT under the impact
of deuterium plasma ions. The optical constants of films (n and k) at a wavelength of λ=632.8 nm and film thickness were determined by the methods of ellipsometry. The spectral reflectance of mirrors and glass plates with a-C film was measured at normal incidence. The dynamics of all parameters was obtained during the film removal. The satisfactory fittings to
the measured reflectance of tested mirrors were found by a programmed selection from a database of n(λ) and k(λ) indices of carbon-based films.
KEY WORDS: in-vessel diagnostic mirrors, carbon-based films, restoration of optical characteristics, deuterium plasma, ellipsometry data of films.
STUDIES OF PROCESSES TAKING PLACE AT SIMS ANALYSIS IN GLYCEROL SOLUTIONS OF ORGANIC DYES
V.N. Melnykov, V.A. Litvinov, V.T. Koppe, V.V. Bobkov, V.V. Tovstyak
Full Text : (270 kB, Rus.)
The work is devoted to investigations of changing of molecule concentration of solute substance in glycerol matrix in result of processes going under a bombardment of sample-solutions
by primary ions at secondary ion mass-spectrometry. The objects of investigations were solutions in glycerol of organic dyes: rhodamine 6G, neutral red, methylene blue, phenol red, methyl orange. It was shown that the molecule concentration of solute substance in near surface layer of glycerol matrix had been formed as a result of competition of processes:
destruction of molecules by primary ions during the analysis and renewal of this layer with undamaged molecules diffusing from the solution bulk. Even at the ion current density Ar+ about 0.3 mkA/cm2 lowering of equilibrium concentration of molecules of solute substance in near surface layer of a sample was noted, that should be taken into account at secondary ion mass-
KEY WORDS: secondary ion mass-spectrometry, glycerol matrix, ion bombardment influence, organic dyes.
X-RAY PHOTOELECTRON SPECTROSCOPY OF ULTRA THIN TITANIUM AND TITANIUM NITRIDE FILMS, OBTAINED BY ION BEAM SPUTTER DEPOSITION
A.N. Styervoyedov, V.I. Farenik
Full Text : (240 kB, Rus.)
The results of investigations of ultra thin titanium and titanium nitride films on silicon, obtained by ion beam sputtering of titanium target both in vacuum and nitrogen atmosphere, using argon ions with energy of 5 keV and target current about 15 mkA are presented in this paper. Elemental composition and chemical state of obtained films were investigated by x-ray
photoelectron spectroscopy with using of Mg-Kα x-ray radiation (photon energy hν=1253.6 eV). Reviewed photoelectron spectrums of samples surface, obtained in different steps of films synthesis, detailed spectrums of photoelectron emission from Si2p, Ti2p, N1s core levels and also x-ray photoelectron spectrums of Auger electron emission are presented.
KEY WORDS: titanium, titanium nitride, ultra thin films, ion beam sputtering, X-ray photoelectron spectroscopy, XPS.